Local Mapping of Generation and Recombination Lifetime in BiFeO₃ Single Crystals by Scanning Probe Photoinduced Transient SpectroscopyALEXE, Marin.Nano letters (Print). 2012, Vol 12, Num 5, pp 2193-2198, issn 1530-6984, 6 p.Article

Self-assembled nanoscale ferroelectrics : Frontiers of ferroelectricityALEXE, Marin; HESSE, Dietrich.Journal of materials science. 2006, Vol 41, Num 1, pp 1-11, issn 0022-2461, 11 p.Article

Interfaces in nanosize perovskite titanate ferroelectrics: microstructure and impact on selected propertiesHESSE, Dietrich; ALEXE, Marin.Zeitschrift für Metallkunde. 2005, Vol 96, Num 5, pp 448-451, issn 0044-3093, 4 p.Conference Paper

Higher-order electromechanical response of thin films by contact resonance piezoresponse force microscopy : Nanoscale ferroelectricsHARNAGEA, Catalin; PIGNOLET, Alain; ALEXE, Marin et al.IEEE transactions on ultrasonics, ferroelectrics, and frequency control. 2006, Vol 53, Num 12, pp 2309-2322, issn 0885-3010, 14 p.Article

Direct Observation of Continuous Electric Dipole Rotation in Flux-Closure Domains in Ferroelectric Pb(Zr,Ti)O₃JIA, Chun-Lin; URBAN, Knut W; ALEXE, Marin et al.Science (Washington, D.C.). 2011, Vol 331, Num 6023, pp 1420-1423, issn 0036-8075, 4 p.Article

Nucleation-Induced Self-Assembly of Multiferroic BiFeO₃―CoFe₂O₄ NanocompositesSTRATULAT, Sergiu M; XIAOLI LU; MORELLI, Alessio et al.Nano letters (Print). 2013, Vol 13, Num 8, pp 3884-3889, issn 1530-6984, 6 p.Article

Non-Kolmogorov―Avrami―Ishibashi Switching Dynamics in Nanoscale Ferroelectric CapacitorsKIM, Yunseok; HAN, Hee; LEE, Woo et al.Nano letters (Print). 2010, Vol 10, Num 4, pp 1266-1270, issn 1530-6984, 5 p.Article

Elastic coupling between 90° twin walls and interfacial dislocations in epitaxial ferroelectric perovskites : A quantitative high-resolution transmission electron microscopy studyCHU, Ming-Wen; SZAFRANIAK, Izabela; HESSE, Dietrich et al.Physical review B. Condensed matter and materials physics. 2005, Vol 72, Num 17, pp 174112.1-174112.5, issn 1098-0121Article

High-resolution electron energy-loss spectroscopy of BaTiO₃/SrTiO₃ multilayersZHANG, Jingmin; VISINOIU, Alina; HEYROTH, Frank et al.Physical review B. Condensed matter and materials physics. 2005, Vol 71, Num 6, pp 064108.1-064108.7, issn 1098-0121Article

Fabrication of porous Pt-Pd electrodes using solid state interdiffusionNAZARPOUR, S; CHAKER, M.Thin solid films. 2012, Vol 520, Num 14, pp 4812-4815, issn 0040-6090, 4 p.Conference Paper

Magnetoelectric Coupling in Ordered Arrays of Multilayered Heteroepitaxial BaTiO₃/CoFe₂O₄ NanodotsXIAOLI LU; YUNSEOK KIM; GOETZE, Silvana et al.Nano letters (Print). 2011, Vol 11, Num 8, pp 3202-3206, issn 1530-6984, 5 p.Article

Epitaxial growth of multilayered (Bi,La)₄Ti₃O₁₂/Pb(Zr,Ti)O₃ ferroelectric thin films with different orientationsDINGHUA BAO; XINHUA ZHU; ALEXE, Marin et al.Journal of electroceramics. 2008, Vol 21, Num 1-4, pp 72-77, issn 1385-3449, 6 p.Conference Paper

Texture optimization process of ZnO:Al thin films using NH₄Cl aqueous solution for applications as antireflective coating in thin film solar cellsFERNANDEZ, S; GANDIA, J. J.Thin solid films. 2012, Vol 520, Num 14, pp 4698-4702, issn 0040-6090, 5 p.Conference Paper

Metal-induced negative oxide charge detected by an alternating current surface photovoltage in thermally oxidized Fe-contaminated n-type Si (001) wafersSHIMIZU, Hirofumi; OTSUKI, Tomohiro.Thin solid films. 2012, Vol 520, Num 14, pp 4808-4811, issn 0040-6090, 4 p.Conference Paper

Proceedings of the EMRS 2009 Spring Meeting Symposium H: Synthesis, Processing and Characterization of Nanoscale Multi Functional Oxide Films IICRACIUN, Valentin; GUILLOUX-VIRY, Maryline; ALEXE, Marin et al.Thin solid films. 2010, Vol 518, Num 16, issn 0040-6090, 277 p.Conference Proceedings

A novel approach for fabrication of bismuth-silicon dioxide core-shell structures by atomic layer depositionLEE, Jongmin; FARHANGFAR, Shadyar; RENBIN YANG et al.Journal of material chemistry. 2009, Vol 19, Num 38, pp 7050-7054, issn 0959-9428, 5 p.Article

Proceedings of the EMRS 2011 Spring Meeting Symposium D: Processing and Characterization of Nanoscale Multi Functional Oxide Films IIICRACIUN, Valentin; GUILLOUX-VIRY, Maryline; ALEXE, Marin et al.Thin solid films. 2012, Vol 520, Num 14, issn 0040-6090, 323 p.Conference Proceedings

Ultrahigh Density Array of Epitaxial Ferroelectric Nanoislands on Conducting SubstratesKIM, Youngsuk; HAN, Hee; KIM, Yunseok et al.Nano letters (Print). 2010, Vol 10, Num 6, pp 2141-2146, issn 1530-6984, 6 p.Article

Structural and multiferroic properties of epitaxial γ-Fe₂O₃-BiFeO₃/Bi_3.25La_0.75 Ti₃O₁₂ composite bi-layersGAUTREAU, Olivier; HARNAGEA, Catalin; GUNAWAN, Lina et al.Journal of physics. D, Applied physics (Print). 2008, Vol 41, Num 11, issn 0022-3727, 112002.1-112002.6Article

Ferroelectric/Antiferroelectric Pb(Zr_0.8Ti_0.2)O₃/PbZrO₃ Epitaxial Multilayers : Growth and Thickness-Dependent PropertiesBOLDYREVA, Ksenia; PINTILIE, Lucian; LOTNYK, Andriy et al.Ferroelectrics (Print). 2008, Vol 370, pp 140-146, issn 0015-0193, 7 p.Conference Paper

Characterization of sol-gel derived TiO₂/ZrO₂ films and powders by Raman spectroscopyNAUMENKO, A; GNATIUK, Iu; SMIRNOVA, N et al.Thin solid films. 2012, Vol 520, Num 14, pp 4541-4546, issn 0040-6090, 6 p.Conference Paper

Correlation between strain and the metal-insulator transition in epitaxial V₂O₃ thin films grown by Molecular Beam EpitaxyDILLEMANS, L; LIETEN, R. R; MENGHINI, M et al.Thin solid films. 2012, Vol 520, Num 14, pp 4730-4733, issn 0040-6090, 4 p.Conference Paper

Defect generation during silicon oxidation: A Kinetic Monte Carlo studyALI-MESSAOUD, A; CHIKOUCHE, A; ESTEVE, A et al.Thin solid films. 2012, Vol 520, Num 14, pp 4734-4740, issn 0040-6090, 7 p.Conference Paper

Electronic structure and formation mechanism of complex Ti-Nb oxideKHOVIV, D. A; ZAYTSEV, S. V; IEVLEV, V. M et al.Thin solid films. 2012, Vol 520, Num 14, pp 4797-4799, issn 0040-6090, 3 p.Conference Paper

Fabrication and characterization of nanoporous ZnO layers for sensing applicationsWAGNER, Alexander; BAKIN, Andrey; OTTO, Torsten et al.Thin solid films. 2012, Vol 520, Num 14, pp 4662-4665, issn 0040-6090, 4 p.Conference Paper